Big Chemical Encyclopedia

Chemical substances, components, reactions, process design ...

Articles Figures Tables About

High-resolution electron micrograph

Carbon tubules (or nanotubes) are a new form of elemental carbon recently isolated from the soot obtained during the arc-discharge synthesis of fuller-enes[I]. High-resolution electron micrographs do not favor a scroll-like heUcal structure, but rather concentric tubular shells of 2 to 50 layers, with tips closed by curved, cone-shaped, or even polygonal caps. Later work[2] has shown the possibility of obtaining singleshell seamless nanotubes. [Pg.59]

Fig. I. High-resolution electron micrographs of graphitic particles (a) as obtained from the electric arc-deposit, they display a well-defined faceted structure and a large inner hollow space, (b) the same particles after being subjected to intense electron irradiation (note the remarkable spherical shape and the disappearance of the central empty space) dark lines represent graphitic layers. Fig. I. High-resolution electron micrographs of graphitic particles (a) as obtained from the electric arc-deposit, they display a well-defined faceted structure and a large inner hollow space, (b) the same particles after being subjected to intense electron irradiation (note the remarkable spherical shape and the disappearance of the central empty space) dark lines represent graphitic layers.
Fig. 3. High-resolution electron micrograph (HREM) of oxidised CNT tips. Note the amorphous carbon residue inside the lower nanotube (marked with an arrow). Fig. 3. High-resolution electron micrograph (HREM) of oxidised CNT tips. Note the amorphous carbon residue inside the lower nanotube (marked with an arrow).
Since a considerable amount of review articles on both theoretical frameworks and calculated results have been reported[15-25], the main objective of the present study is placed on the comparisons with experimental results. The organization of the present report is as follows In the next section, for the sake of completeness, a brief theoretical description of the PPM is summarized from the previous articles. In the third section, disorder-LIq transition is focused and visualized atomic (spin) configuration is compared with recent high resolution electron micrograph. In the fourth section, ordering relaxation... [Pg.84]

Figure 3 High resolution electron micrograph for Cu-Au LXq ordered phase [29]. Black and white dots indicate different species and black stripes are Anti Phase Domain boundaries. The lattice mismatch across the domain boundary is clearly observed by referring to the guide lines in white. Figure 3 High resolution electron micrograph for Cu-Au LXq ordered phase [29]. Black and white dots indicate different species and black stripes are Anti Phase Domain boundaries. The lattice mismatch across the domain boundary is clearly observed by referring to the guide lines in white.
FIGURE 9.2 This high-resolution electron micrograph shows the unique pore structure of the ZSM-5 zeolite catalyst. Molecules such as methanol and hydrocarbons can he catalytically converted within the pores to valuable fuels and lubricant products. Courtesy, Mobil Research and Development Corporation. [Pg.170]

Figure 1. High resolution Electron Micrograph of a cubic MgO crystal viewed in [100] direction showing square net of 22 fringes and apparent bending of atom planes at edges. Courtesy of Dr. T. Tanji. Figure 1. High resolution Electron Micrograph of a cubic MgO crystal viewed in [100] direction showing square net of 22 fringes and apparent bending of atom planes at edges. Courtesy of Dr. T. Tanji.
Figure 1. High-resolution electron micrograph and corresponding optical transform (inset) of an x-ray amorphous zeolite-Y specimen that has undergone ion-exchange with a solution containing U022+ ions. The microcrystalline regions are rendered visible by the locally ordered U022+ ions. ( See text.)... Figure 1. High-resolution electron micrograph and corresponding optical transform (inset) of an x-ray amorphous zeolite-Y specimen that has undergone ion-exchange with a solution containing U022+ ions. The microcrystalline regions are rendered visible by the locally ordered U022+ ions. ( See text.)...
Fig. 1.8 High resolution electron micrographs of thin sections showing electron optical fringes (a) indicative of inclusion of mica in kaohnite and (b) interstratification of kaolinite and other layer sihcates. Fringes shown indicate the spadngs of basal plans viewed from the edge (Dixon,... Fig. 1.8 High resolution electron micrographs of thin sections showing electron optical fringes (a) indicative of inclusion of mica in kaohnite and (b) interstratification of kaolinite and other layer sihcates. Fringes shown indicate the spadngs of basal plans viewed from the edge (Dixon,...
Fig. 2.9 High-resolution electron micrographs of anthophyllite. Displacive fault termination or "zippers," and an interpretation based on the I beam structure of the amphiboles. Fig. 2.9 High-resolution electron micrographs of anthophyllite. Displacive fault termination or "zippers," and an interpretation based on the I beam structure of the amphiboles.
Figure 2.17 High-resolution electron micrographs and the corresponding Mossbauer spectra of small (1.7 nm) and larger (4nm) nanoparticles with a PtSn supported on silica [125] (5 is the isomer displacement and A is the quadrupole splitting). Figure 2.17 High-resolution electron micrographs and the corresponding Mossbauer spectra of small (1.7 nm) and larger (4nm) nanoparticles with a PtSn supported on silica [125] (5 is the isomer displacement and A is the quadrupole splitting).
Fig. 4.5 High resolution electron micrograph of synthetic goethite crystals cut perpendicular to the needle axis [010]. The crystals are bounded by 101 faces. The large crystal contains faults and some of the smaller, fault-free crystals show ca. 1 nm lattice fringes corresponding to the c -parameter of the unit cell (0.9956 nm) (Schwertmann, 1984, with permission, courtesy H. Vali, Schwertmann Cornell, 2000, with permission). Fig. 4.5 High resolution electron micrograph of synthetic goethite crystals cut perpendicular to the needle axis [010]. The crystals are bounded by 101 faces. The large crystal contains faults and some of the smaller, fault-free crystals show ca. 1 nm lattice fringes corresponding to the c -parameter of the unit cell (0.9956 nm) (Schwertmann, 1984, with permission, courtesy H. Vali, Schwertmann Cornell, 2000, with permission).
Fig. 4.6 High resolution electron micrograph of natural goethite a) Diamond-shaped cross sections of domains running along [010] and bounded by 101 faces. Lattice fringes correspond to the c -parameter. b) Higher magnification shows the a fringes (ca. 1 nm) and structural distortions. (Smith Eggleton, 1983 with permission courtesy R.A. Eggleton). Fig. 4.6 High resolution electron micrograph of natural goethite a) Diamond-shaped cross sections of domains running along [010] and bounded by 101 faces. Lattice fringes correspond to the c -parameter. b) Higher magnification shows the a fringes (ca. 1 nm) and structural distortions. (Smith Eggleton, 1983 with permission courtesy R.A. Eggleton).
Fig. 4.8 High resolution electron micrograph of two goethite domains and their interdomai-nic zone. The lattice fringes at 0.5 nm correspond to the (200) spacing (courtesy S. Mann, Bristol). Fig. 4.8 High resolution electron micrograph of two goethite domains and their interdomai-nic zone. The lattice fringes at 0.5 nm correspond to the (200) spacing (courtesy S. Mann, Bristol).
Fig. 14.3 High resolution electron micrographs of the thermal transformation of goethite to hematite showing (Gt[001]//[Hm[210] orientation. Upper Gradual development (a d) of slit pores along Hm[001]. Lower Largely transformed region along the (Gt[001]//[Hm[210] orientation. Electron diffraction patterns in the in-... Fig. 14.3 High resolution electron micrographs of the thermal transformation of goethite to hematite showing (Gt[001]//[Hm[210] orientation. Upper Gradual development (a d) of slit pores along Hm[001]. Lower Largely transformed region along the (Gt[001]//[Hm[210] orientation. Electron diffraction patterns in the in-...
Fig. 4.4.3 High-resolution electron micrograph and electron diffraction pattern. (A) Sample II the mean diameter and lattice fringe of particles X and Y were 7.7 nin, 0.374 nm. and 7.1 nm, 0.397 nm, respectively. (B) Sample V the 15.4-nm particle was viewed along the [0011 zone axes with the 100 lattice spacing of 0.397 nm. (From Ref. 10.)... Fig. 4.4.3 High-resolution electron micrograph and electron diffraction pattern. (A) Sample II the mean diameter and lattice fringe of particles X and Y were 7.7 nin, 0.374 nm. and 7.1 nm, 0.397 nm, respectively. (B) Sample V the 15.4-nm particle was viewed along the [0011 zone axes with the 100 lattice spacing of 0.397 nm. (From Ref. 10.)...
Fig. 4.4.4 High-resolution electron micrographs and power spectra of sample VI (A) Hexagonal structure in the [001 ] orientation with distortions dloo, d0l0, dy 10 = 0.396,0.377, 0.403 nm (B) cubic structure close to the [110] orientation with distortions dm = 0.407 nm, d- m = 0.394 nm, and d2no = 0.332 nm. (From Ref. 10.)... Fig. 4.4.4 High-resolution electron micrographs and power spectra of sample VI (A) Hexagonal structure in the [001 ] orientation with distortions dloo, d0l0, dy 10 = 0.396,0.377, 0.403 nm (B) cubic structure close to the [110] orientation with distortions dm = 0.407 nm, d- m = 0.394 nm, and d2no = 0.332 nm. (From Ref. 10.)...
FIGURE 5.38 High resolution electron micrograph of the W4Nb26 077 structure, depicting strings of (4x4) and (3x4) blocks. CS planes between tbe blocks have a darker contrast. (Photograph courtesy of Dr. [Pg.267]

Fig. 2.18 High resolution electron micrograph of V O2 -i (n = 8). Note that the regular intergrowth of 2V8O15 and V7O13 is seen in a rather wide region. Fig. 2.18 High resolution electron micrograph of V O2 -i (n = 8). Note that the regular intergrowth of 2V8O15 and V7O13 is seen in a rather wide region.
Figures 2.49 and 2.50 show the high resolution electron micrographs, corresponding to the case of (2)-[l] and (2)-[2], respectively. Although intuitive interpretations for these pictures are not simple, comparing them with those for the shear or block structures, the calculated images are qualitatively in agreement with the observed ones. ... Figures 2.49 and 2.50 show the high resolution electron micrographs, corresponding to the case of (2)-[l] and (2)-[2], respectively. Although intuitive interpretations for these pictures are not simple, comparing them with those for the shear or block structures, the calculated images are qualitatively in agreement with the observed ones. ...
Fig. 2.49 High-resolution electron micrograph showing spacing anomaly (a) EDP showing spacing anomaly (b) electron micrograph at low magnification (c) electron micrograph of the enclosed area of (b) at high magnification. Fig. 2.49 High-resolution electron micrograph showing spacing anomaly (a) EDP showing spacing anomaly (b) electron micrograph at low magnification (c) electron micrograph of the enclosed area of (b) at high magnification.
Fig. 61. (a) High-resolution electron micrograph of oilretite viewed along [100] direction 477) (b) schematic drawing (c) computer simulation, e and s refer to eight- and six-membered rings, respectively. [Pg.310]

Fig. 62. High-resolution electron micrograph of erionite viewed along [ 100] direction (476). The stacking defect marked by arrows consists of a single sheet of the sodalite structure. Fig. 62. High-resolution electron micrograph of erionite viewed along [ 100] direction (476). The stacking defect marked by arrows consists of a single sheet of the sodalite structure.
Figure 8. High-resolution electron micrographs showing cross-section of FePt/Pt/MgO sample (a) [001] projection. Note surface flatness (b) [110] projection showing FePt/Pt/MgO interface region. Insets show corresponding selected-area electron diffraction patterns [13]. Figure 8. High-resolution electron micrographs showing cross-section of FePt/Pt/MgO sample (a) [001] projection. Note surface flatness (b) [110] projection showing FePt/Pt/MgO interface region. Insets show corresponding selected-area electron diffraction patterns [13].
Fig. 10. High-resolution electron micrograph of a (3,4) intergrowth structure involving the Aurivillius phases Bi4Ti30I2 (n = 3) and... Fig. 10. High-resolution electron micrograph of a (3,4) intergrowth structure involving the Aurivillius phases Bi4Ti30I2 (n = 3) and...
Fig. 12. High-resolution electron micrograph of BijWO, intergrowth bronze. The dark circles between the W03 slabs represent bismuth atoms. Fig. 12. High-resolution electron micrograph of BijWO, intergrowth bronze. The dark circles between the W03 slabs represent bismuth atoms.
Fig. 21. (a) High resolution electron micrographs of carbon nanotubes and (b) High resolution electron micrographs of nanotubes and onions (from this laboratory). [Pg.111]

FIGURE 19 High-resolution electron micrographs of some typical sub-5 nm lanthanide nanoparticles EU2O3. Reprinted with permission from Bazzi et al. (2003). Copyright 2003 Elsevier. [Pg.316]


See other pages where High-resolution electron micrograph is mentioned: [Pg.339]    [Pg.542]    [Pg.136]    [Pg.88]    [Pg.837]    [Pg.837]    [Pg.241]    [Pg.40]    [Pg.263]    [Pg.258]    [Pg.260]    [Pg.542]    [Pg.339]    [Pg.480]    [Pg.123]    [Pg.123]    [Pg.134]    [Pg.267]    [Pg.731]    [Pg.218]   
See also in sourсe #XX -- [ Pg.133 , Pg.136 ]




SEARCH



Electron micrograph

Electron micrographs

© 2024 chempedia.info