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High resolution coating device

A study of various coating devices was conducted several years ago to identify the best conductive coating for high resolution SET taken using a TEM (with a scanning attachment) with a... [Pg.138]

The mierostructure of the pieces formed was evaluated by means of a scanning electron microscope (SEM), using the high-resolution transmission electron microscope JEOL SM 840. Samples were placed on an aluminium grate and coated with gold using the ion sputtering device JEOL JFC 1100. [Pg.35]


See other pages where High resolution coating device is mentioned: [Pg.137]    [Pg.122]    [Pg.202]    [Pg.137]    [Pg.122]    [Pg.202]    [Pg.121]    [Pg.212]    [Pg.121]    [Pg.121]    [Pg.140]    [Pg.206]    [Pg.126]    [Pg.258]    [Pg.268]    [Pg.106]    [Pg.142]    [Pg.77]    [Pg.137]    [Pg.149]    [Pg.149]    [Pg.410]    [Pg.341]    [Pg.472]    [Pg.609]    [Pg.444]    [Pg.192]    [Pg.598]    [Pg.396]    [Pg.351]    [Pg.1447]    [Pg.2051]    [Pg.1198]    [Pg.250]    [Pg.252]    [Pg.169]    [Pg.139]    [Pg.32]    [Pg.1203]    [Pg.509]    [Pg.129]    [Pg.764]    [Pg.38]    [Pg.931]    [Pg.204]    [Pg.415]    [Pg.504]    [Pg.381]   
See also in sourсe #XX -- [ Pg.202 , Pg.203 ]




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