Grazing-incidence X-ray diffraction GIXRD

Figure 9.15 Electrochemical cells for in situ grazing incidence X-ray diffraction (GIXRD) and grazing incidence X-ray absorption spectroscopy (GIXAD). (A) Thin-layer ceU for XAS in reflection and grazing incidence XRD XE, entrance X-ray beam XR, reflected X-ray beam PE, polyethylene foil WE, working electrode RE, reference electrode CE, counter electrode EL, electrolyte SH, sample holder and (B) ceU for XAS in transmission and reflection. XE entrance X-ray beam, XR reflected X-ray beam, WE working electrode, CE counter electrode RE reference electrode, W windows, B1 beam aperture, entrance beam, B2 beam aperture, reflected beam, and blocking direct beam (according to Strehblow). (Reproduced with permission from Ref. [22], 2006, Walter de Gruyter Co.)...

Grazing-incidence x-ray diffraction (GIXRD) is a method of characterizing the ordered and amorphous nanostructure of the surface of materials. Tang et al. 

Grazing incidence X-ray diflftaction (GIXRD) experiments were carried out at room temperature using a Seifert URD-6 diffractometer equipped with a DSA 6 attachment. CuKa radiation was used at 30 kV and 10 mA. Monochromatization of the beam was obtained by means of a nickel filter and a pulse-height analyzer. The angle of incidence was fixed to 0.5°, so that the X-rays penetration into the sample could be kept constant during measurements. Diffraction scans were collected for 20 values from 2° to 60° with a step of 0.1°. 

Figure 5.16 A schematic diagram of the measurement of interfacial stress in a multilayered fihn. GIXRD, grazing-incidence X-ray diffraction. (From [11], reprinted with permission of Elsevier.)...

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