GIXRD

Kyotani, T., Mizuno, T., Katakura, Y., Kakui, S., Shimotsuma, N., Saito, )., and Nakane, T. (2007) Characterization of mbular zeolite NaA membranes prepared from dear solutions by ETIR-ATR, GIXRD and EIB-TEM-SEM.J. Membr. Sci., 296,162-170. 

In this study, two methods of xrd-rsms and gixrd were applied to ferroelectric thin film. Which xrd-rsm is chosen depends on the orientation of the thin film media. In the following session, details of these two xrd-rsms and the gixrd and the comparison of them to the conventional 20 — 0 scan method are discussed. 

The rocking curve full width at half maximum intensity (fwhm) was characterized at the 100/001 diffraction for pzt 52/48 thin films with gixrd geometry. Figure 6.12 shows the calculated diffraction pattern distribution for pzt 52/48 thin films based on the lattice parameters obtained from xrd-rsms shown in Figure 6.6. As shown in Figure 6.12, the 1001001 diffraction includes 100 diffraction of c-domains, the 001 diffraction of a-domains and the 100 diffraction of the pseudocubic phase. Therefore, fwhm obtained by this measurement indicates a twist of all these phases. 

Fig. 19 GIXRD data for F8BT with molecular weight 255 kg/mol (A-C) and with molecular weight of 9 kg/mol (D-F). (A and D) Pristine, (B and E) annealed to Tg and slowly cooled, and (C and F) annealed to Tm and slowly cooled. The inner and outer rings in (A) correspond to the (001) and (004) reflections, respectively. The most likely orientations of the polymers with respect to the substrate is shown in (G), with the jt-stacking direction indicated by arrows. Reprinted with permission from [77]. (2005) by the American Chemical Society...

Case 1 Mn < M. The structure of uniaxially aligned LMW PF2/6 has been recently studied by combination of optical spectroscopy, NEXAFS and GIXRD, Fig. 22 exhibits a representative NEXAFS data and the subsequent analysis. These data support a structural model in which there is a graded morphology such that the top and bottom surfaces exhibit extensive planar, uniaxial alignment while the film interior is less well oriented and includes both planar and tilted (i.e., non-planar) PF2/6 chains [114]. 

Fig. 23 GIXRD images from the PF2/6 film studied, a (xyO) plane,

The order parameter s finks R to the mosaic distribution of the azimuthal rotation angle about the surface normal (). The former is measured using optical absorption spectroscopy whereas the latter is measured separately for each crystallite types using GIXRD. In this task it has been assumed that the rod-like molecules are always parallel to the (0yz) plane (i.e., perfectly planar alignment) and a two-dimensional order parameter can be given as... 

In one experimental test case [115] R corresponded to measured values Oo = 11°-15°. These numbers were then compared to those obtained by GIXRD. For the three crystallite types I—III respective values of 9 = 8.8 0.2°,... 

Field emission scanning electron microscopy (FESEM), glancing incidence x-ray diffraction (GIXRD), transmission electron microscopy (TEM), micro Raman scattering, Fourier transform inftaied (FTIR) spectrometry, Rutherford back scattering (RBS) studies and electron probe micro analysis (EPMA) have been carried out to obtain micro-structural and compositional properties of the diamond/p-SiC nanocomposite films. Atomic force microscopy (AFM) and indentation studies have been carried out to obtain film properties on the tribological and mechanical front. 

D GIXRD patterns of 1 1 RR-P3HT PCBM films (spin-coated at lOOOrpm) fabricated with different ty (a) 30s and (b) 80s. ID out-of-plane (c) X-ray and (d) azimuthal scan (at ij(lOO)) profiles extracted from (a) and (b). (Reused from li, G. et al., Adv. Funct. Mater., 17, 1636, 2007. With permission.)... 

Figure 9.15 Electrochemical cells for in situ grazing incidence X-ray diffraction (GIXRD) and grazing incidence X-ray absorption spectroscopy (GIXAD). (A) Thin-layer ceU for XAS in reflection and grazing incidence XRD XE, entrance X-ray beam XR, reflected X-ray beam PE, polyethylene foil WE, working electrode RE, reference electrode CE, counter electrode EL, electrolyte SH, sample holder and (B) ceU for XAS in transmission and reflection. XE entrance X-ray beam, XR reflected X-ray beam, WE working electrode, CE counter electrode RE reference electrode, W windows, B1 beam aperture, entrance beam, B2 beam aperture, reflected beam, and blocking direct beam (according to Strehblow). (Reproduced with permission from Ref. [22], 2006, Walter de Gruyter Co.)...

---