FTIR-Assisted Chemical Component Analysis in Thermal Degradation of Silicones

4 FTIR-Assisted Chemical Component Analysis in Thermal Degradation of Silicones 

The stretching vibration from carbonyl carbon and amide groups can be seen at 1500 cm.  

The XPS spectroscopy was used to study the extent of hetro-condensation uid homo-condensation in sihca-titania film produced by sol-gel route. The homo-condensation and hetro-condensation species (i.e., Si-O-Ti, 01s, 532 eV) coexisted and increased with the increase in temperature. It was cdso realized that homo-condensation giving birth to Si-O-Si (Ols, 533.2 eV) and Ti-O-Ti (Ols, 531.3 eV) bonds leads to phase separation in the material. Additionally, it was noticed that non-bridging oxygen in the film increases with an increase in temperature and TiO concentration [42,43]. Similarly, 100 nm film of SiO -TiOj nanocomposite was prepared and the chemical state of the elements present on the surface was investigated by XPS. The Ols peak at 531.7 eV appeared due to the Si-O in SiO. The titanium on the surface existed as TiO (Ols, 528.5 e 0 as well as in Ti O (Ols, 530 eV) state. It was also noticed 

Position (cm ) Assignment Position (cm ) Assignment Position (cm ) Assignment 

---