Fourier transform infrared spectroscopy spectrometer with microscope

The samples were characterized by means of X-ray diffraction (XRD) analysis, Fourier-transform infrared spectroscopy (FTIR), transmission electron microscopy (TEM), electron diffraction (ED), and Mossbauer spectroscopy. XRD analysis was carried out on a HZG-4A diffractometer by using Ni-filtered Co Ka radiation. IR-spectra were recorded on an AVATAR FTIR-330 spectrometer. TEM/ED examinations were performed with a LEO 906E and a JEOL 4000 EX transmission electron microscopes. The resonance spectra were recorded in air at 298 K and processed by using a commercial SM2201 MSssbauer spectrometer equipped with a 15 mCi Co (Rh) source. 

In some cases the changes of chemical structure were examined by Fourier Transform Infrared Spectroscopy (ETIK) on Bmker ISF 66/V spectrometer equipped with a Hyperion microscope with ATR (Ge) objective. 

The method of diffuse transmittance (DT) is based on measurement of the radiation component 7dt (Fig. 1.22) that passes diffusely through an inhomogeneous layer. This method was first applied to the IR spectroscopic analysis of thin films on samples in powder form by Tolstoy in 1985 [116, 117], who obtained DT spectra of water adsorbed onto silica gel. When used in conjunction with a FTIR spectrometer, the method is called diffiise-transmittance infrared Fourier transform spectroscopy (DTIFTS). DTIFTS is the most recently developed IR spectroscopic methods for studying powder surfaces and has already found application in high-performance liquid chromatography (HPLC) and thin-layer chromatography (TLC) [118, 119]. Of increasing popularity are DTIFTS measurements of powders that use an IR microscope to collect radiation [112, 119] (Section 4.3). 

---