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Fine-line lithography

A Perspective on Resist Materials for Fine-Line Lithography... [Pg.39]

Although the bulk properties such as sensitivity (E0), contrast (y), and developer selectivity (n) discussed earlier represent characteristics of a resist, fine line lithography provides the most meaningful and precise judgment on the performance of a resist. [Pg.212]

N.D. Wittels, Tundamentals of electron and x ray lithography, in Fine Line Lithography, R. Newman, Ed., pp. 1 104, North Holland Pubhshing, Amsterdam (1980). [Pg.30]

Bowden M.J. and Thompson L.F. 1979. Resists for fine line lithography. Solid State TechnoL, 22(5), 72-82. [Pg.295]


See other pages where Fine-line lithography is mentioned: [Pg.350]    [Pg.691]    [Pg.9]    [Pg.217]    [Pg.614]   


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Fine lines

Resist materials, fine-line lithography

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