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Evanescent waves scattering

See D. C. Prieve, "Measurement of colloidal forces with TIRM," Adv. Colloid Interface Sci., 82, 93-125 (1999), for a clear description of technique as well as references also S. G. Bike, "Measuring colloidal forces using evanescent wave scattering," Curr. Opin. in Colloid Interface Sci., 5, 144-50 (2000). [Pg.353]

This basic concept applies to our technique as well. In microsphere nanoscopy, microspheres are in direct contact with objects, which forms a Particle-on-Surface (POS) system, as illustrated in Fig. 8(a). It is this POS system that effectively interacts with the near-field evanescent waves, decouples and turns them into propagating wave that would reach the objective lens in the far-field. Like in NSOM, such interaction are quite complicated and only takes place in the proximity of the interface of particle and substrate, which was indicated by the shadow zone in Fig. 8(a). The characteristic thickness of the evanescent waves scattering zone, dg, could be decided by ... [Pg.205]

Gas sensors based on sol-gel films were widely investigated for the detection of O2 [169-171], CO2, CO, H2 [172], H2S, I2, NH3, NO, and NO2 and were summarized in Refs [173,174]. Fiber-optic sensors for humidity based on evanescent wave scattering and absorption were prepared by doping the sol-gel coating with methylene blue [175]. Sensors were also developed for the determination of... [Pg.1253]

The null-field method is used to compute the T matrix of each individual particle and the T-matrix formalism is employed to analyze systems of particles. For homogeneous, composite and layered, axisymmetric particles, the null-field method with discrete sources is applied to improve the munerical stability of the conventional method. Evanescent wave scattering and scattering by a half-space with randomly distributed particles are also discussed. To extend the domain of applicability of the method, plane waves and Gaussian laser beams are considered as external excitations. [Pg.332]


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See also in sourсe #XX -- [ Pg.174 ]




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