Electron probe microanalysis, ceramic

Is Your Solder Pad Joining "Hairy" As part of a solder/flux/ cleaning procedure, the residue In Figure 10 (Insert) was produced. The residue consists of 6xl0pm leaf-like crystals on a ceramic substrate. The location of the residue prevented Its analysis In-sltu, so extraction replication(5) was used to remove some of the crystals for analysis by several small area techniques, as needed. Electron probe microanalysis showed lead, carbon and oxygen, which could Indicate many possibilities. 

Chemical information about the surfaces and interfaces of sintered ceramics can be obtained using electron probe microanalysis (EPMA), Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS or ESCA), ion scattering spectroscopy (ISS), secondary ion mass spectroscopy (SIMS), and ultraviolet photoelectron spectroscopy (UPS). 

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