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Electromigrated break junctions

A break junction can also be created by passing a current (0.5-1.0 V) through an Au nanowire (<20 nm diameter) defined by electron-beam lithography and shadow evaporation. Such electromigrated break junctions (EMBJs) have yielded reproducible 1-3 nm gaps between electrodes [48-50]. [Pg.47]

A break junction is formed by breaking a thin metallic wire to produce a narrow gap between two conductors. Bridging this gap by a single or a few molecules creates a metal-molecule-metal junction, as illustrated in Fig. 10.8. The metallic wire can be broken by mechanical deformation (mechanically controlled break junctions, MCBs) or by electromigration. [Pg.381]

The abihty to measure and to control charge transport across nanometer-scale metal-molecule-metal junctions represents a key step toward the realization of molecular-based electronics [190-192]. Various experimental approaches have been employed to study molecular junctions in two- and three-terminal configurations. These include scanning probe microscopies (STM, STS, CP-AFM) [193-208], crossed-wire junctions [209], mechanical [210-215] and electromigration [216,217] break junctions, nanopores [218] and mercury drop electrodes [219]. Approaches in condensed media, and in par-... [Pg.231]


See other pages where Electromigrated break junctions is mentioned: [Pg.811]    [Pg.811]    [Pg.124]    [Pg.48]    [Pg.1856]    [Pg.209]   
See also in sourсe #XX -- [ Pg.47 ]




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Break junctions

Electromigration

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