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Electric-field-induced resistive switching

Tungsten offers high degree of compatibility and ease of processing of the integrated circuit when WO is used as active material in RRAM. [Pg.453]

With a further increase in thickness ( 25 nm), the switching direction is reversed (sohd curves). While sweeping the voltage in a positive direction ( 1.2 V), the device switched into a LRS and the reset operation was carried out by applying a negative bias (—IV). The sweeping voltage was in the sequence 0 Vmax 0 - Vmax 0, and exhibited counterclockwise [Pg.454]


See other pages where Electric-field-induced resistive switching is mentioned: [Pg.452]    [Pg.452]    [Pg.452]    [Pg.452]    [Pg.143]    [Pg.90]    [Pg.143]    [Pg.396]    [Pg.431]    [Pg.77]    [Pg.373]    [Pg.668]    [Pg.373]    [Pg.93]    [Pg.197]    [Pg.320]    [Pg.146]    [Pg.318]    [Pg.251]    [Pg.581]    [Pg.134]    [Pg.229]   
See also in sourсe #XX -- [ Pg.452 , Pg.453 , Pg.454 ]




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