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Dynamical rules 3:3:3 profiles

Figure 4.7 shows the steady- and dynamic-viscosity profiles as functions of shear rate for a filled reactive epoxy-resin moulding compound. Here, interestingly, the Cox-Merz rule provides a better correlation than does the modified Cox-Merz rule. [Pg.327]

Figures 3,46-3.49 show typical profiles of several key dynamic measures for rules belonging to classes 1 and 2. Their behavior on is known to consist of relatively short transient times leading to any number of cycles of short length. Figures 3,46-3.49 show typical profiles of several key dynamic measures for rules belonging to classes 1 and 2. Their behavior on is known to consist of relatively short transient times leading to any number of cycles of short length.
The relationship between steady-shear viscosity and dynamic-shear viscosity is also a common fundamental rheological relationship to be examined. The Cox-Merz empirical rule (Cox, 1958) showed for most materials that the steady-shear-viscosity-shear-rate relationship was numerically identical to the dynamic-viscosity-frequency profile, or r] y ) = r] m). Subsequently, modified Cox-Merz rules have been developed for more complex systems (Gleissle and Hochstein, 2003, Doraiswamy et al., 1991). For example Doriswamy et al. (1991) have shown that a modified Cox-Merz relationship holds for filled polymer systems for which r](y ) = t] (yco), where y is the strain amplitude in dynamic shear. [Pg.326]

There are a number of exact sum rules that the density profiles neqr electrodes have to satisfy. One set of these rules is due to the special long range nature of the Coulomb forces, which give rise to the screening of the charges in conducting media. The second set of sur mles originates from force balance requirements, and are the dynamic sum mles. [Pg.139]

An exception to the above rule (the access to molecular information in Dynamic SIMS) is noted when using large cluster primary ions (C, Ar , etc., where n can equal several thousands). This is realized because these ions introduce the possibility of molecular depth profiling and imaging. Cluster ion beams can also be used to examine surface distributions under Static-like conditions. As a result, the use of cluster ion beams in SIMS opens many new fields of application (Mahoney 2013). [Pg.6]

A method to be selected for evaluating the foundation stiffness must adequately reflect the shape of the foundation-soil interface the amount of embedment the nature of the soil profile and the mode of vibration and frequencies of excitatiOTi. The uncoupled spring approach satisfies all these conditions. It is accomplished through determining the dynamic impedance functirais for the foundation. This method is adequate if the seismic foundation loads are not expected to exceed twice the ultimate foundation capacities. As illustrated in Fig. 2, the dynamic impedance model is an uncoupled single node model that represents the foundation element. An upper and lower bound approach to evaluating the foundation stiffness is often used because of the uncertainties in the soil properties and the static loads on the foundations. As a general rule of thumb, a factor... [Pg.299]


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See also in sourсe #XX -- [ Pg.112 , Pg.114 ]




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