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Dynamic force mode

To minimize effects of friction and other lateral forces in the topography measurements in contact-modes AFMs and to measure topography of the soft surface, AFMs can be operated in so-called tapping mode [53,54]. It is also referred to as intermittent-contact or the more general term Dynamic Force Mode" (DFM). A stiff cantilever is oscillated closer to the sample than in the noncontact mode. Part of the oscillation extends into the repulsive regime, so the tip intermittently touches or taps" the surface. Very stiff cantilevers are typically used, as tips can get stuck" in the water contamination layer. The advantage of tapping the surface is improved lateral resolution on soft samples. Lateral forces... [Pg.20]

Dynamic force mode AFM This mode is developed for the soft features. An oscillating cantilever is used to image surface features in dynamic force mode. There are two main types of dynamic mode [17]. [Pg.159]

Amplitude, modulation mode or dynamic force mode... [Pg.116]

Dynamic force or tapping mode commonly referred to as tapping mode, it is also referred to as intermittent contact or, more generally, dynamic force mode (DFM). A stiff cantilever is oscillating at a short distance from the surface, closer than in noncontact mode. The oscillation range includes the repulsive region of the curve, so the tip intermittently touches or taps the... [Pg.240]

Therefore, when operating in the filter cake mode, the axial velocity should be maintained at a level such that an adequate shear force exists along the filter media to prevent excessive caking of the catalyst that could cause a blockage in the down-comer circuit. For the separation of ultrafine catalyst particles from FT catalyst/wax slurry, the filter medium can easily become plugged using the dynamic membrane mode filtration. Also, small iron carbide particles (less than 3 nm) near the filter wall are easily taken into the pores of the medium due to their low mass and high surface area. Therefore, pure inertial filtration near the filter media surface is practically ineffective. [Pg.274]

In indirect photofragmentation, on the other hand, a potential barrier or some other dynamical force hinders direct fragmentation of the excited complex and the lifetime amounts to at least several internal vibrational periods. The photodissociation of CH3ONO via the 51 state is a representative example. The middle part of Figure 1.11 shows the corresponding PES. Before CH30N0(5i) breaks apart it first performs several vibrations within the shallow well before a sufficient amount of energy is transferred from the N-0 vibrational bond to the O-N dissociation mode, which is necessary to surpass the small barrier. [Pg.109]

DC-EFM Dynamic contact mode electrical force microscopy... [Pg.89]

Force modulation imaging is the dynamic contact mode that identifies and maps differences in surface stiffness or elasticity. These techniques use a variety of surface properties to differentiate among materials where topographical differences are small or not measurable. [Pg.161]

Pulsed force mode scans on the thin film of the phase separated blend of P2VP and PtBMA show pronounced contrast in two imaging modes, i.e., height and adhesion, while the stiffness suffers to some extent from artefacts. In a new mode called combined dynamic X mode SFM, these problems are overcome [30]. [Pg.203]

Structures vibrate when an applied force varies with time. Cyclic force repeatedly peaks and drops off the time between peaks is the frequency. Although the dynamic force may not follow a smooth curve with a simple frequency, most forces can be viewed as combinations of sinusoidal cyclic forces and different frequencies. Likewise, the dynamics of a structure can be characterized by discrete resonant frequencies, or modes, each with its own unique shape. Structures react to the entire spectrum of applied force frequencies, but the response to the resonant... [Pg.655]

Noncontact mode (or dynamic force) imaging relies on longer-range molecular forces to obtain surface topology. The cantilever is oscillated at its resonance frequency by a piezoactuator. The surface topography is measured by the shift in cantilever frequency based on tip/sample interactions. Specialized expertise is required to avoid image artifacts. [Pg.3180]


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