Diffraction limited region

Figure 3.20 A schematic idea for an imaging IR microspectrometer system using the synchrotron source and FPA detector. The FPA detector serves to spatially oversample a diffraction-limited region of the specimen for subsequent PSF deconvolution and resolution enhancement.

Because there are two changes ia material composition near the active region, this represents a double heterojunction. Also shown ia Figure 12 is a stripe geometry that confines the current ia the direction parallel to the length of the junction. This further reduces the power threshold and makes the diffraction-limited spreading of the beam more symmetric. The stripe is often defined by implantation of protons, which reduces the electrical conductivity ia the implanted regions. Many different stmctures for semiconductor diode lasers have been developed. 

For the largest telescopes being developed (w 30m) the diffraction limit at a wavelength of l/ttm is about 50 parsecs at z = 2 — 8, or about lAU at 150pc (the nearest star forming regions). 

Rotational spectroscopy and microwave astronomy are the most accurate way to identify a molecule in space but there are two atmospheric windows for infrared astronomy in the region 1-5 im between the H2O and CO2 absorptions in the atmosphere and in the region 8-20 xrn. Identification of small molecules is possible by IR but this places some requirements on the resolution of the telescope and the spacing of rotational and vibrational levels within the molecule. The best IR telescopes, such as the UK Infrared Telescope on Mauna Kea in Hawaii (Figure 3.13), are dedicated to the 1-30 xm region of the spectrum and have a spatial resolution very close to the diffraction limit at these wavelengths. 

Fig. 2. Depth discrimination (z-axis resolution) properties of a confocal microscope. The illumination and detection images in a confocal microscope are diffraction-limited and confined to a small region of the specimen (1). Only light emitted in the plane of focus and on the optical axis will pass the detector pinhole and form an image. Light emitted from other areas of the specimen does not enter the detector pinhole.

Near-field optics is another promising way to achieve high-density optical memory. Since near-field techniques overcome the diffraction limit of light by the contribution of evanescent wave, it is possible to store a bit datum in a nanometric region. The nanometric resolution is achieved by the contribution of evanescent fields. 

One of the important functions of this infrared microscope is the measurement of the IR spectrum from a spatial region smaller than the diffraction limit. This possibility is already illustrated in Figure 29.4e. The TFD-IR spectrum, that corresponds to the IR absorption spectrum, was measured from a fluorescence region smaller than the IR diffraction limit. Infrared spectroscopy in a sub-micron region will be possible by using a high NA objective lens with the confocal optical system. 

---