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Diffraction contrast, electron microscopy

Powder X-ray diffraction (XRD) data were collected via a Siemens D5005 diffractometer with CuKa radiation (A. = 1.5418 A). Routine transmission electron microscopy (TEM) and Z-contrast microscopy were carried out using an HITACH HD-2000 scanning transmission electron microscope (STEM) operated at 200 kV. Nitrogen gas adsorption measurements (Micromeritics Gemini) were used to determine the surface area and porosity of the catalyst supports. Inductively coupled plasma (ICP) analysis was performed via an IRIS Intrepid II XSP spectrometer (Thermo Electron Corporation). [Pg.58]

TECHNIQUES OF HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HREM), TRANSMISSION EM (TEM) DIFFRACTION CONTRAST, AND ANALYTICAL EM (AEM)... [Pg.562]

Transmission electron microscopy (TEM) has been an underutilized yet valuable too in particle size characterization of MC particles in LB films. Monolayer films of trioctylphosphine oxide-capped CdSe (18), spread as a monolayer on an aqueous subphase, were transferred to a TEM grid. A close-packed hexagonal arrangement of 5.3-nm (cr —4%) crystallites was found. TEM images were also obtained for HMP-stabilized CdS incorporated in BeH/octadecylamine films (79) and for CdS formed under an amine-based surfactant monolayer and transferred to a TEM grid (14). In one study, direct viewing of CdS and CdSe particles made from Cd2+-FA films on TEM grids was not possible due to poor phase contrast between the particles and the film (30). Diffraction patterns were observed, however, that were consistent with crystalline (3-CdS or CdSe. Approximately spherical particles of CdSe could... [Pg.251]

The diameter of the primary particles ranges from 5 to 500 nm. Diffraction patterns produced by the so-called phase-contrast method in high-resolution electron microscopy show that the spherical primary particles are not amorphous (Fig. 48). They consist of relatively disordered nuclei surrounded by concentrically deposited carbon layers [4.2], The degree of order increases from the center to the periphery of each particle, a phenomenon important to the understanding of the chemical reactivity of carbon black. [Pg.144]

A comparative study has been made by optical and electron microscopy of the anisotropic texture of several cokes from caking coals and pitches carbonized near their resolidification temperature. A simple technique made it possible to examine, by both methods, the same area of each sample and to identify the corresponding zones of the two very similar images. The anisotropy observed in polarized light appears in electron microscopy as differences in contrast resulting not from inequalities in electron absorption, but, as revealed by microdiffraction and dark Reid examinations, from diffraction phenomena depending on the general orientation of the carbon layers within each anisotropic area. [Pg.249]


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See also in sourсe #XX -- [ Pg.1086 , Pg.1100 ]




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Diffraction contrast

Diffraction electron microscopy

Electron diffraction

Electron diffraction contrast

Electronic diffraction

Electrons diffracted

Microscopy contrast

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