Dielectric-measurement parameters Resolution

The state of polarization of light, reflected from an interface, depends strongly on the profile of the dielectric constant across that interface. This simple principle is used in the Brewster angle reflection ellipsometry (BAE), where one measures the ellipticity coefficient of light, reflected from an interface. The method is sensitive enough to detect extremely small changes in the structure of liquid crystalline-solid interfaces. Subnanometer resolution of the adsorption parameter is routinely achieved. The method is therefore very useful for the study of liquid crystal interfaces, where the surface-induced variation of the order can be observed [5,25,33-41]. 

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