Determining Composition and Structure

All methods of surface analysis are based on primary particle irradiation of analyzed samples, causing primary flux disturbance or emission of secondary particles from the surface. Table 2 presents a classification of the most popular methods of analysis based on 

Excitation-Emission Matrix of Thin-Film Analysis  

A comparative analysis of the existing analytical techniques is presented in a number of works (see, e.g., Refs. 131 and 132). As can be seen in Table 3, all problems of anodic alumina analysis 

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