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Depth-Sensitive Information from AES

In conclusion, AES is mainly used to study the elemental surface composition of conducting samples. It can be used to create chemical maps of heterogeneous surfaces, and also to study the vertical distribution of elements as a function of depth. The technique is of great importance in surface science and materials science, though less important in the characterization of supported catalysts. [Pg.81]

Ertl and J. Ktippers, Low Energy Electrons and Surface Chemistry. VCH, Weinheim, 1985. [Pg.81]

Siegbahn, C. Nordling, A. Fahlman, H. Nordberg, K. Hamrin, J. Hedman, G. Johansson, T. Bergmark, S.E. Karlsson, J. Lindgren, and B. Lindberg, [Pg.81]

Electron Spectroscopy for Chemical Analysis Atomic, Molecular and Solid State Structure Studies hy means of Electron Spectroscopy. Almquist and Wiksells, Stockholm, 1967. [Pg.82]

Turner, C. Baker, A.D. Baker, and C.R. Brundle, Molecular Photoelectron Spectroscopy. Wiley, London, 1970. [Pg.82]


See other pages where Depth-Sensitive Information from AES is mentioned: [Pg.90]    [Pg.75]    [Pg.80]   


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