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Depth profiling spectrometer dependence

The potential of LA-based techniques for depth profiling of coated and multilayer samples have been exemplified in recent publications. The depth profiling of the zinc-coated steels by LIBS has been demonstrated [4.242]. An XeCl excimer laser with 28 ns pulse duration and variable pulse energy was used for ablation. The emission of the laser plume was monitored by use of a Czerny-Turner grating spectrometer with a CCD two-dimensional detector. The dependence of the intensities of the Zn and Fe lines on the number of laser shots applied to the same spot was measured and the depth profile of Zn coating was constructed by using the estimated ablation rate per laser shot. To obtain the true Zn-Fe profile the measured intensities of both analytes were normalized to the sum of the line intensities. The LIBS profile thus obtained correlated very well with the GD-OES profile of the same sample. Both profiles are shown in Fig. 4.40. The ablation rate of approximately 8 nm shot ... [Pg.235]


See other pages where Depth profiling spectrometer dependence is mentioned: [Pg.243]    [Pg.244]    [Pg.160]    [Pg.74]    [Pg.266]    [Pg.76]    [Pg.652]    [Pg.253]    [Pg.532]    [Pg.3718]    [Pg.4564]    [Pg.4603]    [Pg.13]    [Pg.415]    [Pg.653]    [Pg.652]    [Pg.1065]    [Pg.108]    [Pg.150]    [Pg.269]   
See also in sourсe #XX -- [ Pg.194 , Pg.750 ]




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Depth profiles

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