Dependence of Free-Ion Yield on Molecular Structure and Mobility

4 DEPENDENCE OF FREE-ION YIELD ON MOLECULAR STRUCTURE AND MOBILITY 

Schiller and Vass (1975) attempted a theoretical correlation between free-ion yield and electron mobility in a trapping model, and thereby further correlation with V. In this model, electrons are trapped due to local energy fluctuations with a probability 

The authors assume different and statistically independent mechanisms of electron-ion recombination in the quasi-free and trapped states. Thus P = w, where and wt are respectively the probabilities of escaping recombination in the quasi-free and trapped states. Based on some heuristic and not entirely plausible arguments, wq( is approximately equated to 1/2. The probability of finding a trapped electron at a distance between r and r + dr from the positive ion is given by (crtP dr/v) exp(-crPr/v), where P, is again the probability of finding an 

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Dependence of Free-Ion Yield on Molecular Structure and Mobility... 

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