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Current-voltage characteristic device

The first realization of a conjugated polymer/fullerene diode [89] was achieved only recently after the detection of the ultrafasl phoioinduced electron transfer for an lTO/MEH-PPV/CW)/Au system. The device is shown in Figure 15-18. Figure 15-19 shows the current-voltage characteristics of such a bilayer in the dark at room temperature. The devices discussed in the following section typically had a thickness of 100 nm for the MEH-PPV as well as the fullerene layer. Positive bias is defined as positive voltage applied to the 1TO contact. The exponential current tum-on at 0.5 V in forward bias is clearly observable. The rectification ratio at 2 V is approximately l()4. [Pg.594]

Fig. 11.4. Logarithmic amplifier, (a) Schematic of a logarithmic amplifier. A diode is used as the feedback element in a current amplifier. The current-voltage characteristics are exponential. The output voltage is then proportional to the logarithm of the input current, (b) The transfer curve of a typical logarithmic amplifier, AD757N from Analog Devices. The reference current is internally set to be 10 p,A. It is accurate up to six decades. Fig. 11.4. Logarithmic amplifier, (a) Schematic of a logarithmic amplifier. A diode is used as the feedback element in a current amplifier. The current-voltage characteristics are exponential. The output voltage is then proportional to the logarithm of the input current, (b) The transfer curve of a typical logarithmic amplifier, AD757N from Analog Devices. The reference current is internally set to be 10 p,A. It is accurate up to six decades.
Fig. 8. Current-voltage characteristics of two hypothetical devices of identical physical size. The gallium arsenide curve rises faster and reaches peak velocity faster than the silicon. This means that the group III-V (13-15) electrons produce significantly faster operating times in microchips. (AT T Technology)... Fig. 8. Current-voltage characteristics of two hypothetical devices of identical physical size. The gallium arsenide curve rises faster and reaches peak velocity faster than the silicon. This means that the group III-V (13-15) electrons produce significantly faster operating times in microchips. (AT T Technology)...
Experimental current-voltage characteristic of a pumping cell having the structure shown in Fig. 3b for two different O2 concentrations in N2. The temperature of the device was 750 C. [Pg.142]

The current-voltage characteristics of the ITO/polymer 22 and 23/C60/Al devices under illumination with simulated solar light (100 mW/cm2). [Pg.177]

FIGURE 7. Current-voltage characteristic of the device ITO/PEDOT PSS/polymer 30 PCBM/A1 under illumination with simulated AM 1.5 solar light. [Pg.181]

As the structures and current-voltage characteristic of OFETs have been well described in many other articles [8-13], herein we only give a very simple introduction on the basics of phthalocyanine-based OFET devices. [Pg.278]

Fig. 3 Schematic diagram of current-voltage characteristics of (a) p-type, (b) n-type, and (c) ambipolar OFET device... Fig. 3 Schematic diagram of current-voltage characteristics of (a) p-type, (b) n-type, and (c) ambipolar OFET device...
In this section we discuss a method of controlled material degradation for individual organic semiconductors and also for the blends used in bulk heterojunction solar cells [37]. The degradation is studied using attenuated total reflection Fourier transform infrared spectroscopy (ATR-FTIR) and by determining current/voltage characteristics (I/V measurements) of the devices. [Pg.237]

IV. Static Current-Voltage Characteristics of Virgin Devices... [Pg.279]

Fig. 2. (a) Static current-voltage characteristics of a virgin (unformed) p+-n-i device. The positive quadrant corresponds to a positive bias applied to thep+ layer, (b) The data for 30°C in (a) plotted in the form of log conductivity versus voltage and illustrating the change from ohmic to nonohmic behavior. [Pg.280]

Fig. 3. Current-voltage characteristics of a device in the ON state, at different temperatures, in the forward and reverse directions. The forward direction corresponds to p+ layer positively biased. ( ) forward bias, 80°C (A) forward bias, 30 C (O) reverse bias, 80°C (A) reverse bias, 30 C. Fig. 3. Current-voltage characteristics of a device in the ON state, at different temperatures, in the forward and reverse directions. The forward direction corresponds to p+ layer positively biased. ( ) forward bias, 80°C (A) forward bias, 30 C (O) reverse bias, 80°C (A) reverse bias, 30 C.
Fig. 4. Complete static current-voltage characteristics of a formed a-Si p+-n-i device, showing the forward and reverse threshold voltages, Vand respectively. Fig. 4. Complete static current-voltage characteristics of a formed a-Si p+-n-i device, showing the forward and reverse threshold voltages, Vand respectively.

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See also in sourсe #XX -- [ Pg.210 , Pg.217 , Pg.218 ]




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