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Conventional transmission electron microscopy CTEM

D. Auguie, M. Oberlin, A. Oberlin and P. Hyvemat, Microtexture of mesophase spheres as studied by high resolution conventional transmission electron microscopy (CTEM), Carbon, 18,337-346 (1980). [Pg.262]

As in the field of condensed matter sciences, polymer research has made extensive use of conventional transmission electron microscopy (CTEM) ever since its invention. Polymer research focuses on materials that mainly consist of carbon and other light elements. These materials are relatively weak electron scatterers and therefore give low mass thickness and phase contrast. Mass thickness contrast may be enhanced using an objective aperture, staining, and/or low... [Pg.48]

There are two main classes of electron micro.s-copy (EM) techniques. In the first class, the electron probe is a stationary beam incident along a fixed direction. This incident beam can be parallel [conventional transmission electron microscopy (CTEM), high-resolution transmission electron microscopy (HRTEM), high-voltage transmission... [Pg.1077]

TEM has two basic modes, one is conventional transmission electron microscopy (CTEM or TEM for short) mode using a broad beam, another one is scanning TEM (STEM for short) using a focused electron probe (by focusing the electron beam into a narrow spot) scanning across TEM specimen in a raster. [Pg.189]

Conventional and scanning transmission electron microscopy (CTEM and STEM) were done on a JEOL 100C electron microscope. The scanning (secondary emission) electron microscopy was done on a JEOL U3. [Pg.181]

Wash-coat separated from the cordierite monolith by scraping was examined directly by two electron microscopy techniques CTEM (Conventional Transmission Electron Microscopy) and STEM (Scanning Transmission Electron Microscopy). [Pg.815]

Silica (Degussa Aerosil, 200 m /g) was used as the support material. Conventional electron microscopy (CTEM) was performed on a Oeol 100 CX microscope. It was used to determine the particles size of both supported monometallic and bimetallic catalysts. Scanning Transmission Electron Microscope (STEM) HB 5 from Vacuum Generator was used to characterize the bimetallic catalysts. Infrared spectra were obtained with a Nicolet 10 MX-1 Fourier transform instrument. It was used to characterize the alkyl groups evolution on the surface during reaction between Rh/Si02 and Sn(n-C Hg). ... [Pg.718]


See other pages where Conventional transmission electron microscopy CTEM is mentioned: [Pg.556]    [Pg.409]    [Pg.1078]    [Pg.42]    [Pg.556]    [Pg.409]    [Pg.1078]    [Pg.42]    [Pg.156]    [Pg.83]    [Pg.79]    [Pg.89]    [Pg.69]    [Pg.101]    [Pg.93]    [Pg.87]    [Pg.101]    [Pg.79]    [Pg.523]   
See also in sourсe #XX -- [ Pg.1077 ]

See also in sourсe #XX -- [ Pg.42 ]




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