Characterization of monolayer and

Langevin, D., Optical techniques for the characterization of monolayers and thin liquid films, in Modern Characterization Methods of Surfactant Systems, Binks, B.P. (ed.), Marcel Dekker, New York, 1999, 181. 

Characterization of Monolayer and Multilayer Film In order to study the molecular aggregation state of the monolayer, ED observation was carried out. The monolayer was transferred onto the collodion-covered electron microscope grids covered with an evaporated hydrophilic SiO layer by an upward drawing method.(76j The ED pattern was obtained with a transmission electron microscope (TEM) (Hitachi H-7000) which was operated at an acceleration voltage of 75 kV, a beam current of 0.5 xA and an electron beam spot size of 10 pm in diameter. 

---