Catalyst elemental analysis EDX and XPS

Samples for catalyst elemental analysis were prepared as follows After taken from the continuous stirred tank (CST), they were let settle down overnight. 

The supernatant was removed after 12h of settling. The catalyst-rich solution was used for analysis. A few drops of fhis concentrate were placed over silicon films and the water was let to evaporate. Dried samples were then analyzed. 

Selected samples from various experiments were analyzed in energy dispersive X-ray spectroscopy (EDX). These analyses were carried out on a Hitachi S-4500 field emission scanning electron microscopy equipped with an EDAX Phoenix model EDX spectrometer. An electron beam of 15 kV was used. These samples were also analyzed in a Krafos Axis Ulfra X-ray phofoelectron spectroscopy (XPS). 

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