Cantilever in AFM

Cantilevers in AFM function as force transducers converting unknown force to measurable deflection. The value of the unknown force can then be expressed by Hookean mechanics following spring constant calibrations. In addition to static point loads, cantilevers can also be vibrated, e.g., by an oscillation piezo to which the fixed end of the beam is attached (or by other approaches). Excitation frequency, oscillation amplitude, and phase relationships are variables that govern dynamic tapping (intermittent contact) imaging. This problem will be discussed in the next section. 

Friction measurements are performed by measuring the twisting of the cantilever in AFM contact mode that is, the lateral deflection. Stronger deflection is observed for higher friction between sample and... 

A highly significant recent development is the integration of atomic force microscopy with SECM (AFM-SECM) [220]. Further details are described in Chapter 3.2 of this volume. An etched Pt wire was flattened and then insulated with electrophoretic paint. This probe acts as the cantilever in AFM and as the SECM tip providing dual force-sensing and electrochemical capabilities. Submicron resolution for SECM and for topography by AEM was achieved for test samples of track-etched polycarbonate membranes and ionic crystal surfaces. As the resolution of the technique improves and it is combined with other scanning probes, it seems likely that SECM can be applied in an ever-wider spectrum of scientific fields. 

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See also in sourсe #XX -- [ , , , , , , , , , ]

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