Bragg-Brentano configuration

Figure 2.56. Comparison of patterns obtained with laboratory systems working in parallel geometry or in the Bragg-Brentano configuration. These patterns were realized by Vermulen from the PANAlytical company...

The diffracted intensity is directly related to the irradiated volume . When a bulky sample is studied in reflection, its thickness is infinite with respect to X-ray penetration arrd, as we have already mentioned, if the study is conducted in syrrunetric diffraction (Bragg-Brentano configuration), then the volirme remairts the... 

X-Ray diffraction patterns of grafted supports were recorded on powder samples on a Panalytical X Pert diffractometer, in Bragg-Brentano configuration with a X-ray tube with a Cu anticathode (wavelength Kai = 1,5406 A). 

Figure 1.7 shows an XRD diffractogram 20/co scan from an instrument under Bragg Brentano configuration using Cu radiation. The sample was a powder prepared from a rock obtained near the Michigan Lake. The basic general interpretation of that type of data is as follows ... 

The X-ray diffraction measurements were performed with an X-ray diffractometer (Bruker D8 Discover) in a standard Bragg-Brentano reflection configuration. In a typical experiment the temperature of the cell containing the emulsified sample was decreased from ambient to 173 K at a rate of 10 K mm In order to measure the temperature at which the supercooled liquid droplets homogenously froze to ice, the diffraction angle of a... 

The results of these measurements are shown in Figure 2.37. Note how the use of a strictly parallel beam can greatly improve the diffractometer s angular resolution. As we will see later on, the resolution of this diffractometer is equivalent to that obtained with Bragg-Brentano diffractometers in the high resolution configuration. 

Figure 6.1 Schematic of experimental X-ray set-up. (a) In reflection-mode for XRD (common with the Bragg-Brentano type configuration) and CISAXS (b) In transmission-mode for WAXS (or XRD) and SAXS.

---