Binnig

Binnig G and Rohrer FI 1987 Scanning tunneling microscopy—from birth to adolescence Rev. Mod. Rhys. 59 615... 

Binnig G, Rohrer H, Gerber Ch and Weibel E 1982 Tunnelling through a controllable vacuum gap Appl. Phys. Lett. 40 178... 

Smith D P E, Hdrber H, Gerber Ch and Binnig G 1989 Smectic liquid crystal monolayers on graphite observed by scanning tunnelling microscopy Science 245 43... 

Binnig G, Quate C F and Gerber Ch 1986 Atomic force microscope Phys. Rev. Lett. 56 930... 

Atomic force microscopy (AFM), invented in 1985 by Binnig, Quate, and Gerber [5.4,... 

This slow diffusion of a crucial new technique can be compared with the invention of the scanning tunnelling microscope (STM) by Binnig and Rohrer, first made public in 1983, like X-ray diffraction rewarded with the Nobel Prize 3 years later, but unlike X-ray diffraction quickly adopted throughout the world. That invention, of comparable importance to the discoveries of 1912,now(2 decades later) has sprouted numerous variants and has virtually created a new branch of surface science. With it, investigators can not only see individual surface atoms but they can also manipulate atoms singly (Eigler and Schweitzer 1990). This rapid adoption of... 

G. Binnig, C. F. Quate, C. Gerber. Atomic force microscope. Phys Rev Lett 5(5 930-933, 1986. 

G. Binnig, H. Fuchs, E. Stoll. Surf Sci 7(59 L295-L300, 1986. 

The main technique employed for in situ electrochemical studies on the nanometer scale is the Scanning Tunneling Microscope (STM), invented in 1982 by Binnig and Rohrer [62] and combined a little later with a potentiostat to allow electrochemical experiments [63]. The principle of its operation is remarkably simple, a typical simplified circuit being shown in Figure 6.2-2. 

Binnig et al. [48] invented the atomic force microscope in 1985. Their original model of the AFM consisted of a diamond shard attached to a strip of gold foil. The diamond tip contacted the surface directly, with the inter-atomic van der Waals forces providing the interaction mechanism. Detection of the cantilever s vertical movement was done with a second tip—an STM placed above the cantilever. Today, most AFMs use a laser beam deflection system, introduced by Meyer and Amer [49], where a laser is reflected from the back of the reflective AFM lever and onto a position-sensitive detector. 

The STM method was developed by Binnig and Rohrer, who received the Nobel Prize for their invention. STM is the most mature of the scanning probe methods. A sharp tip (curvature of the order 100 A) is brought close to a surface and a low potential difference (the bias voltage) is applied between sample and tip. 

G.Binnig, H.Rohrer, Ch.Gerber and E.Weibel, Physica(Utrecht), 107B+C(1981)... 

G.Binnig and H.Rohrer, Helv.Phys.Acta, 55(1982)726 Physica, 127B( 1984)37. 

The scanning tunneling microscope (STM) was invented by Binnig and Rohrer in 1982. This quickly led to the award of a Nobel prize in 1986. Initially, STM proved... 

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