ARXPS angle resolved X-ray photoelectron

Two different stages for silver deposition on platinum can be described one at 1.1 V vs. RHE responding to a silver-platinum alloy electrodissolution (overlapped with the oxygen electroadsorption at free platinum sites) and the other at 0.65 V due to the silver oxidation (from the onset of the bulk deposition process) deposited on the former surface alloy [88,89]. The former process splits into two peaks when the potentiostatic ageing is performed. The spectroscopic techniques such as XPS and ARXPS (angle resolved x-ray photoelectron spectroscopy) were used to determine the chemical composition of the silver films on the platinum in an acid solution [92], The technique was not able to discern between the presence of silver oxides and sulfates, only an energy shift of the clean silver 3d5/2 band at a upd level of —0.5 eV was detected. 

Acronyms XPS or XPES X-ray photoelectron spectroscopy, ESCA electron spectroscopy for chemical apphcations (originally analysis), PESIS photoelectron spectroscopy of inner shell, ARXPS angle resolved X-ray photoelectron spectroscopy. 

ARXPS Angle-resolved X-ray photoelectron spectroscopy cfr. ADXPS)... 

UHV analysis can also be applied. Angle resolved x-ray photoelectron spectroscopy (ARXPS) also allows the determination of the film thickness. The method uses the fact that the ratio between the aluminum oxide peak and the peak of the metalKc aluminum changes with angle of incidence since the length of path in the oxide increases for a grazing incidence [70, 71]. 

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