Applications of Polymer-Inorganic Nanocomposites

The main feature of atomic force microscopy (AFM) is that it does not require the surface conductivity, because it measures the scanning probe and the interaction between the tip of AFM and the sample surface. The interaction includes electrostatic, van der Waals, friction, surface tension (capillary), and the magnetic forces, which overcomes the inadequacy of the STM. Unlike the STM, a force map can be obtained from the AFM probe. This map can be interpreted as a reflection of the surface structure and a geometric topology map of magnetic and electrostatic forces. 

In addition to the above spectroscopic methods, there are still a variety of other methods, such as Mossbauer spectroscopy and various other surface analysis methods and dynamic structure spectroscopy. As is well known, there are more than 100 types of surface analysis and surface characterization methods. This shows the difficulty of surface characterization. When one characterizes the surface and its structure, it is necessary to integrate different analysis and characterization methods to complement each other and confirm each other. 

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