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XRPD recorded at different temperatures from room temperature to 25CPC on crystalline NH4 showing the presence of new reflections at 20CPC

XRPD Spectra for Cimetidine Form A

XRPD Spectra for Cimetidine Form B

XRPD Spectra for Cimetidine Form C

XRR curves forthe PEI spraying. NR curves forthe supperlattice films of PSS PAH by spraying, with six layers of deuterated PSS with different spacing layers between perdeuterated PSS layers

XRV measurements at

Xs as a function of rpm. Model predictions compared with data from Middleton et al. ,

XS of the metallic phase in samples M CeOr-N

Xspectra of PAV cast films

XSW data for Co2 adsorbed on the calcite

XSW data Jor As032 adsorbed at the calcite Geochim Cosmochim Acta, 63, p 3153-3157.

XSW standing wave data for Cir adsorbed at the 2 .

Xt as a function of reciprocal temperature .

XT diagram for the cocurrent adsorber of Example 3.9.

XTA spectra of NiTMP in toluene. XAFS region where the first and the second neighboring shells expand in the TI state.

XTEM image of a -oriented grain at the surface. The arrows indicate low angle grain boundaries .

XTEM image of a thermal deposited W Si bi layer.

XTEM image of an isolated diamond particle heteroepitaxially grown on Pt substrate, A indicates a protrusion of Pt into diamond .

XTEM image of diamond crystallites on Si substrate after BEN ,

XTEM image of diamond crystallites on Si substrate after BEN . The inset is an ED pattern .

XTEM image of diamond film deposited on Si using 0.3 CH4 H2, showing the presence of a 50 A-thick P-SiC layer at the interface ,

XTEM image of diamond Pt interface .

XTEM image of the 12-period InGaN GaN MQW showing the sharp interfaces obtained by the MOCVD regrowth.

XTEM image of the Ge-Si multilayer structure. The bright and dark layers arc silicon and germanium, respectively. The thickness of the thin layers is 2 nm. while that of the thicker ones is 10 nm.

XTEM images of sample B prepared by etching sample A using hydrogen plasma for 5 min. Magnification



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