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XPS elemental analysis of carbon on 20ht sample

Ellipsometry was used to measure the total thickness of the polymer brush plus absorbed layers. This value represented an average thickness over the whole polymer brush surface, not a specific point. Two trends were observed an increase in film thickness with reaction time and a decrease in film thickness after hydrolysis. [Pg.47]

As discussed in section 2.7, film thickness is dependent on grafting density. Ellipsometry results demonstrated a relationship between film thickness and reaction time (Tables 5.3-1, 5.3-2). It is suspected that these results demonstrate a relationship between reaction time and grafting density. [Pg.47]

The film thicknesses of the hydrolyzed samples are listed in the last two rows of Table 5.3-2. In both cases, these results indicate thinner films for the hydrolyzed material samples. The acidic conditions seemed to have removed some of the existing layers, decreasing the overall thickness. [Pg.47]

4 Atomic Force Microscopy 5.4.1 Height and Phase Images [Pg.48]


Figure 5.2-4 XPS elemental analysis of carbon on 20ht sample... Figure 5.2-4 XPS elemental analysis of carbon on 20ht sample...



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