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X-ray photoelectron spectro-scopy

D. Briggs in Practical Surface Analysis by Auger and X-ray photoelectron Spectro.scopy Ed. D. Briggs and M.P. Seah, Ch. 9, John Wiley, Chichester (1983). [Pg.175]

C. D. Wagner, W. M. Riggs, L. E. Davis, J. F. Moulder and G. E. Muilenberg, Handbook of X-ray Photoelectron Spectro.scopy, Perkin-Elmer Corp.. Minnesota, 1979. [Pg.291]

Secondary ion mass spectrometry (SIMS), secondary neutral mass spectrometry (SNMS), Auger electron spectroscopy (AES) and x-ray photoelectron spectro.scopy (XPS) can provide depth-.selective elemental profiles, but the... [Pg.358]

See other pages where X-ray photoelectron spectro-scopy is mentioned: [Pg.206]    [Pg.539]    [Pg.206]    [Pg.539]    [Pg.288]   
See also in sourсe #XX -- [ Pg.248 ]



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X-ray photoelectron

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