X-Ray Diffraction of Graphitic Materials

X-ray diffraction is a useful analytical technique to determine the changes in structure that occur during graphitization. A detailed analysis of this technique is given in Ref. 14. As with all crystalline materials, a sharp diffraction pattern is obtained with single-crystal graphite. This pattern is schematically shown in Fig. 4.5.PJ Pronounced crysteillinity is indicated by the development of the 002, 004 and 101 peaks. 

Rgure 4.5. Schematic of diffraction patterns of hexagonal graphite.  

The crystallite size, reviewed in Ch. 3, Sec. 2.1, is measured by x-ray diffraction from the breadth of the (110) and the (002) lines. The calculated value is not the actual size of the crystallite but is a relative value which is useful in determining the degree of graphitization of a carbon structure. The interlayer spacing is also determined from x-ray measurements and is another indication of the degree of graphitization. 

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