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X-ray diffraction, characterization

NMR X-ray EPR = = Characterization by NMR spectroscopy. = Characterization by X-ray diffraction. = Characterization by electron paramagnetic resonance spectroscopy. ... [Pg.167]

This information is reported as the percentage that each of the clay mineral type contributes to total identifiable clay mineral content of the noncarbonate clay-sized fraction of the surface sediments. These percentages were determined by x-ray diffraction, which is luiable to identify noncrystalline solids. Using this technique, clay minerals were found to comprise about 60% of the mass of carbonate-free fine-grained fraction. Most of the noncrystalline soUds are probably mixed-layer clay minerals. Carbonate was removed to facilitate the x-ray diffraction characterization of the clay minerals. In some cases, roimd off errors cause the sum of the percentages of kaolinite, illite, montmorillonite, and chlorite to deviate slightly from 100%. [Pg.371]

Mangenot, S., Leforestier, A., Durand, D., and Livolant, F. (2003) X-ray diffraction characterization of the dense phases formed by nucleosome core particles. Biophys. J. 84, 2570-2584. [Pg.418]

Laplante, F., Bernard, N., Tavares, A., Trasatti, S. and Guay, D. (2006) X-ray photoelectron spectroscopy and X-ray diffraction characterization of rhodium oxides in reductive conditions, in Electrocatalysis, Vol. 2005-11 (eds G.M. Brisard, R. Adzic, V. Birss and A. Wieckowski), The Electrochemical Society, Pennington, NJ. [Pg.268]

The authors would like to acknowledge Drs S. Hantzer, S. Soled and M.S. Touvelle for helpful discussions. We also thank Mr S. Miseo for the X-ray diffraction characterization of vanadium and vanadium powder materials. We would also like to acknowledge Drs R. Kapoor and S.T. Oyama of Virginia Tech, for providing the vanadium carbide powder sample used in Figure 24.4. [Pg.517]

The activity for oxidative methanol reforming (OMR) as a function of time-on-stream was determined for CuO catalysts supported on ZnO or Zr02- The ZnO-supported samples deactivated more quickly than the Zr02-supported samples during 18 hour reactions at 225 °C. X-ray diffraction characterization showed that copper oxide particle size increases during the reaction, which implied that loss of CuO surface area is a cause of deactivation. The data suggested that the increase in CuO particle size was accompanied by sintering of the support, which was facilitated by the presence of water vapor at elevated temperatures. [Pg.229]

Nguyen, 0. U., Martin, D., and Pawlik, D. Raman Scattering and X-Ray Diffraction Characterization Semiconductor Multilayer Mater. Res. l(3) 468-475... [Pg.191]

M. Albakry, M. Guazzato, and M. V. Swain, Biaxial Flexural Strength, Elastic Moduli, and X-Ray Diffraction Characterization of Three Pressable All-Ceramic Materials, J. Prosthel. Dent., 89, 374-80 (2003). [Pg.87]

Final phase composition (a -I- P) of sPS samples solidified in the apparatus described in this work at 5K/s 9 200°C are reported in Fig. 16.9. These were evaluated on the basis of X-ray diffraction characterization [33]. The data clearly show a reduction in the overall final crystallinity by effect of an increase of solidification pressure from 0 to 450 bar. At room pressure (Fig. 16.8) overall final crystallinity degree in the sohd samples gradually decreases with cooling rate, and a phase is predominant at 5 K/s. The effect of an increasing pressure... [Pg.339]

In fact, the early developed Prussian blue, octahedral mixed-valance iron metal ions bridged by cyanide with the general formula Fe4[Fe(CN)6]3 xH20, its first single-crystal X-ray diffraction characterization was conducted by Ludi and coworkers, confirmed the potential to construct 3D coordination polymers through control of metal coordination and assisted metal-ligand assembly. [Pg.2413]

Predict and explain whether nonzero intensities for the (111) and (110) reflections will be observed from X-ray diffraction characterization of the following single crystals ... [Pg.155]


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See also in sourсe #XX -- [ Pg.364 ]

See also in sourсe #XX -- [ Pg.253 , Pg.257 , Pg.264 ]




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X-ray characterization

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