Williamson-Hall plot

Table 9.2.5 Mean Crystallite Size (D) and Mierostrains Coefficient (t ) Inferred from Williamson-Hall Plot for Co,Ni, Powders with Almost the Same Particle Size (dm)...

Table 9.2.6 Mean Crystallite Size ( >) and Microstrains Coefficient (rj) Inferred from Williamson-Hall Plot for Powders in the FeCoNi System...

Figure 4 Williamson-Hall plot of the two samples of Ndo.sS ro.5Mn03 indicating a larger compositional variation of sample 1...

Figure 6 Williamson-Hall plot of SrBi2Ta209 showing how the different strain influences the dielectric properties...

The two broadening effects can be separated by using a Williamson-Hall plot [174], which combines Equations (4.7) and (4.8) to give ... 

If we plot (P cos 0)/X according to (sin 0)/X, we get a straight line with a y-intercept equal to the inverse of the size and a slope equal to the value of the microstrains. This plot is known as the Williamson-Hall plot. 

Figure 6.3. Williamson-Hall plot obtained by using peak by peak fitting of the diffraction pattern produced by the ESRF with nanocrystallized cerium oxide...

Figure 6.4. Williamson-Hall plots obtained by using the Langford method based on diffraction peak fitting of cerium oxide...

Figure 6.5. Williamson-Hall plot obtainedfrom the diffraction pattern of a non-annealed titanium oxide aerogel...

Figure 7.25. Williamson-Hall plots produced for the cross-sections of the (0006) and (00012) maps...

Figure 8.5 Williamson-Hall plots of all (001) reflections for the Pc films of the samples A to F (see Table 8.1). In aU cases the reflections of the (3-phase were evaluated, except for the sample F, for which the reflections of the a-phase were used. The FWHM values are corrected for experimental broadening.

Figure 6 Example of a Williamson-Hall plot for a sample of nanocrystalline ZnO powder exhibiting size and stacking-feult diffraction line broadening according to the hW values. (O) reflections unaffected by mistakes hkD and hWwith /even, h-k= 3n), (A) first reflection set affected by stacking faults (/rWwith / odd, h- k=3n 1), ( ) second reflection set affected by stacking faults (/r/c/with / even, h-k=3n ).

Table 4 Calculated values of crystallite size and microstrain of silver nanoparticles from Williamson-Hall plot...

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