Wiley-SIMS

Buchmeiser. M R. Polymeric Materials in Organic Suithexis amf Catnlvsis. John Wiley Sims. Inc.. New York. NY. 2003. 

A small CD-ROM based library of around 300 secondary ion mass spectra known as the Wiley-SIMS was created by Henderson and co-workers in Manchester UK. (see http //www.surfacespectra.com). 

Y. Nihei, R. Shimizu, H. W. Werner (eds.) SIMS IX, John Wiley and Sons, Chichester... 

Fig. 46. Schematic drawing of the failure surface of a lap joint prepared from hot-dipped galvanized steel substrates (top) and TOF-SIMS line scans showing the distribution of several mass numbers as a function of distance from the edge of the overlap (bottom). Reproduced by permission of John Wiley and Sons from Ref. [57].

Fig. 48. TOF-SIMS image showing that ions characteristic of the polymer are also found in some areas within the initiation zone. Image shows (A) total counts, (B) m/z = 88, (C) tn/z = I1 + 9 and (D) in/z = 604-43. Reproduced by permission of John Wiley and Sons from Ref [57].

Fig. 49. TOF-SIMS images showing that the cation-rich areas in the initiation zone do not corre.spond to polymer-rich areas (A) mjz. = 88 on 24 (B) tnjz = 77 + 91 on 24. Reproduced by permission of John Wiley and Sons from Ref. [571.

Fig. 53. Negative TOF-SIMS spectra of PMDA/ODA polyimide (a) before plasma treatment and after plasma treatment for (b) 1 s and (c) 60 s. Reproduced by permission of John Wiley and Sons from Ref. 33).

Briggs, D., Brown, A. and Vickerman, J.C., Handbook of Static Secondary Ion Mass Spectrometry (SIMS). John Wiley and Sons, Chichester, 1989. 

Chou NJ (1990) XPS/SIMS/AES for surface and interface characterisation of thin polymer films. In Tong HM, Nguyen LT (eds) New characterisation techniques for thin polymer films, J Wiley, New York... 

Sims CT, Stoloff NS, and Hagel WC. Superalloys II, 1987, John Wiley Sons, New York. 

Wasielewski GE and Robb RA. High Temperature Oxidation in The Superalloys, Sims CS, Hagel W, (eds.) p. 287, 1972, John Wiley Sons, Inc., New York. 

Benninghoven, A., Janssen, . T. F., Tiimpner, J. and Werner, W. H., Secondary Ion Mass Spectrometry VIII (Proceedings of the Ninth International Conference on SIMS), A. Benninghoven et al. (eds.) John Wiley Ltd., Sons, Chichester, 509 (1992). 

Figure 6.8 Interference problem in SIMS polyatomic ion formation by sputtering of borophosphosilicate glass using an 02+ primary ion beam. (R. C. Wilson, F. A. Stevie and C. W. Magee, Secondary Ion Mass Spectrometry (1989). Reproduced by permission of John Wiley Sons, Inc.)...

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