Wavelength-dispersive

A widely used procedure for determining trace amounts of selenium involves separating selenium from solution by reduction to elemental selenium using tellurium (as a carrier) and hypophosphorous acid as reductant. The precipitated selenium, together with the carrier, are collected by filtration and the filtered soflds examined directly in the wavelength-dispersive x-ray fluorescence spectrometer (70). Numerous spectrophotometric and other methods have been pubHshed for the deterruination of trace amounts of selenium (71—88). 

Wavelength dispersive x-ray fluorescence spectrometric (xrf) methods using the titanium line at 0.2570 nm may be employed for the determination of significant levels of titanium only by carefiil matrix-matching. However, xrf methods can also be used for semiquantitative determination of titanium in a variety of products, eg, plastics. Xrf is also widely used for the determination of minor components, such as those present in the surface coating, in titanium dioxide pigments. 

Energy dispersive spectrometers can, in general, collect the spectmm faster and are less expensive than the more sophisticated wavelength dispersive spectrometers. However, they do not have the resolution and cannot separate closely spaced lines as easily as the wavelength dispersive spectrometers. 

Both the wavelength dispersive and energy dispersive spectrometers are well suited for quaUtative analysis of materials. Each element gives on the average only six emission lines. Because the characteristic x-ray spectra are so simple, the process of allocating atomic numbers to the emission lines is relatively simple and the chance of making a gross error is small. 

The employment of the technique suggested does not require ultra high resolution of spectrometer (in contrast to technique based on the chemical shift of X-ray line detection) and can be realized on the conventional analytical wavelength-dispersive devices. 

These samples were measured non-destructively by energy-dispersive XRF with synclirotron radiation excitation (SYXRS), by g-XRF, by wavelength-dispersive XRF (WDXRS), and by Rutherford back scattering (RBS), by X-ray reflectometry (XRR) and by destructive secondary ion mass spectrometry (SIMS) as well (both last methods were used for independant comparison). 

The incoming electron beam interacts with the sample to produce a number of signals that are subsequently detectable and useful for analysis. They are X-ray emission, which can be detected either by Energy Dispersive Spectroscopy, EDS, or by Wavelength Dispersive Spectroscopy, WDS visible or UV emission, which is known as Cathodoluminescence, CL and Auger Electron Emission, which is the basis of Auger Electron Spectroscopy discussed in Chapter 5. Finally, the incoming... 

An energy-dispersive X-ray spectrometer and at least one wavelength-dispersive X-ray spectrometer... 

The electron-optical performance of the EPMA system is indistinguishable from that of a conventional scanning electron microscope (SEM) thus, EPMA combines all of the imaging capabilities of a SEM with quantitative elemental analysis using both energy- and wavelength-dispersive X-ray spectrometry. ... 

The analyst has two practical means of measuring the energy distribution of X rays emitted from the specimen energy-dispersive spectrometry and wavelength dispersive spectrometry. These two spectrometers are highly complementary the strengths of each compensate for the weaknesses of the other, and a well-equipped electron probe instrument will have both spectrometers. 

X-Ray Fluorescence analysis (XRF) is a well-established instrumental technique for quantitative analysis of the composition of solids. It is basically a bulk evaluation method, its analytical depth being determined by the penetration depth of the impinging X-ray radiation and the escape depth of the characteristic fluorescence quanta. Sensitivities in the ppma range are obtained, and the analysis of the emitted radiation is mosdy performed using crystal spectrometers, i.e., by wavelength-dispersive spectroscopy. XRF is applied to a wide range of materials, among them metals, alloys, minerals, and ceramics. 

Wavelength Dispersive (X-Ray) Spectroscopy Wavelength Dispersive X-Ray Spectroscopy... 

Before the development of semiconductor detectors opened the field of energy-dispersive X-ray spectroscopy in the late nineteen-sixties crystal-spectrometer arrangements were widely used to measure the intensity of emitted X-rays as a function of their wavelength. Such wavelength-dispersive X-ray spectrometers (WDXS) use the reflections of X-rays from a known crystal, which can be described by Bragg s law (see also Sect. 4.3.1.3)... 

Fig. 4.21. Schematic diagram of spectrometer arrangements for wavelength-dispersive and energy-dispersive X-ray spectroscopy (WDXS/EDXS) in electron microscopy.

FCC feedstocks contain sulfur in the form of organic-sulfur compounds such as mercaptan, sulfide, and thiophenes. Frequently, as the residue content of crude oil increases, so does the sulfur content (Table 2-5). Total sulfur in FCC feed is determined by the wavelength dispersive x-ray fluorescence spectrometry method (ASTM D-2622), The results are expressed as elemental sulfur. 

A diagram of the Multi-Wavelength Dispersive Detector is shown in figure 7. 

Energy dispersive, wavelength dispersive and particle induced techniques... 

Examples of using reference samples for calibration can be found in several chapters of the uses Methods for Geochemical Analysis (Baedecker 1987). Solid reference sample powders are used in cahbrating the dc arc emission, energy-dispersive X-ray and instrumental neutron activation analyses described, while acid-dissolved rock reference samples are used for IGP emission analyses and fused reference samples are used for wavelength-dispersive X-ray analyses. 

Taggart JE Jr, Lindsay JR, Scott BA, Vivit DV, Bartel AJ, Stewart K C (1993) Analysis of geological materials by wavelength-dispersive X-ray fluorescence spectrometry. In Badecker PA, ed. U.S. Geological Survey Bulletin 1770. Methods for Geochemical Analysis, pp E1-E19. 

Since modern FTIR spectrometers can operate in a rapid scan mode with approximately 50 ms time resolution, TRIR experiments in the millisecond time regime are readily available. Recent advances in ultra-rapid scanning FTIR spectroscopy have improved the obtainable time resolution to 5 ms. Alternatively, experiments can be performed at time resolutions on the order of 1-10 ms with the planar array IR technique, which utilizes a spectrograph for wavelength dispersion and an IR focal plane detector for simultaneous detection of multiple wavelengths. ... 

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