Thermal wave micrographs

Figure 5 Electron (a) and thermal-wave (b) micrographs at 50X of an Al-Zn alloy. The thermal-wave micrograph shows the Al-Zn grains, and the presence of Fe or Sn precipitates.

Figure 3 Examples of subsurface mechanical defects in a Si device. The electron micrograph (a) shows no defect features. The thermal-wave image (b) shows a subsurface network of microcracks in the lower half of the device and a subsurface delamination or chip-out in the top center.

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