Synchrotron radiation-based photoelectron spectroscopy

Looking at the specificity in terms of the information level, LMMS and S-SIMS inherently rank high because full molecular information (i.e., MW - -structural fragments) is obtained. In contrast, EPX-MA, X-ray and synchrotron radiation based methods are confined to elemental analysis, while the bond-specific information of X-ray photoelectron spectroscopy, p-infrared (IR), or Raman spectroscopy is insufficient for characterizing unknown mixtures. 

D. -S. Yang (2004) in Comprehensive Coordination Chemistry II, eds J.A. McCleverty and T.J. Meyer, Elsevier, Oxford, vol. 2, p. 182 - An overview of photoelectron spectroscopy, including the use of synchrotron radiation and laser-based techniques. 

Photoelectron spectroscopy (PES) is a technique based on the photoelectric effect, which was first documented in 1887 by Hertz and explained in 1905 by Einstein. The use of soft x-ray sources led to the development of x-ray photoelectron spectroscopy (XPS), originally known as electron spectroscopy for chemical analysis (ESCA) [1], indicating the applicability of the method to studies of chemical properties. In parallel with the development of XPS, ultraviolet photoelectron spectroscopy (UPS) [2], i.e., PES based on ultraviolet photon sources, emerged as a tool for studying the valence electronic structure of gaseous and solid samples. However, the increasing use of the continuous spectral distribution of synchrotron radiation [3,4] as a photon source has made the historical terminology less... 

In this chapter, we have considered the contributions that have been made by photoelectron spectroscopy to understanding the Ce problem. We have emphasized synchrotron radiation photoemission studies because of the advantages of that technique (section 2). We have shown that the features observed in photoemission spectra are related to the final state rather than the ground state. We have shown that very recent photoemission studies have shown that two 4f related features are observed, and we have discussed how these can be viewed based on the sophisticated models of many authors (sections 3 and 4). Finally, we reviewed the experimental situation for many Ce compounds, noting the significant progress that has been made in the last few years. 

The availability of synchrotron radiation sources has stimulated the development of interfacial characterization techniques based on scattmng of x-rays and photoelectrons. For example, near-edge x-ray absorption fine structure (NEXAFS) analysis of surface monolayer films gives information on molecular orientation that is complementary to that usually obtained by vibrational spectroscopy. X-ray diffraction from interfaces, in particular x-ray standing wave techniques, now appear to be very promising as tools for providing vertical profiles of well-ordered surface structures at angstrom resolutions. ... 

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