Surface resolving power

Measurements of surface disorder require a high resolving power (the ability to distinguish two close-lying points in the diffraction pattern). Quantitative measurements of surface disorder are limited in the following manner, the worse the resolving power, the smaller the maximum scale of surface disorder that can be detected. For example, if the maximum resolvable distance of the diffractometer is 100 A, then a surface that has steps spaced more than 100 A apart will look perfect to the instrument. The theoretical analysis of disorder is much simpler than that for atomic positions. 

In the same way, spatial resolving power is a measure of the efficiency of distribution-analytical methods in micro- and surface analysis as well as scanning methods. From all the systematic representations of distribution-analytical problems given in Danzer et al. [1991], the mostly relevant are represented in Fig. 7.12. 

Fig. 7.12a). In the special case where Z is fixed perpendicular to the surface of the sample the depth resolving power Rdepth = d/Ad is relevant which becomes important for depth profile and thin-film analysis. 

It is now possible to observe nanometer features on the surfaces of zeolitic materials using high-resolution scanning electron microscopy. By taking ibidem measurements in combination with atomic force microscopy we are able to illustrate the strengths and weaknesses of both techniques and judge respective resolving power. 

Examination of powdered materials with an electron microscope can generally disclose the presence of surface imperfections and pores. However, those imperfections or irregularities smaller than the microscope s resolving power will remain hidden. Also hidden is the internal structure of the pores, their inner shape and dimensions, their volume and volume distribution as well as their contribution to the surface area. However, by enveloping each particle of a powder sample in an adsorbed film, the method of gas adsorption can probe the surface irregularities and pore interiors even at the atomic level. In this manner a very powerful method is available which can generate detailed information about the morphology of surfaces. 

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