Surface differential X-ray diffraction

Fundamentals. The scattered X-ray from crystal planes or a thin metal film can interfere coherently with scattered X-rays from an adsorbate layer. This phenomenon is called surface differential X-ray diffraction (SDD) or Bragg peak interference. The theory has been described elsewhere in detail [43,44], Information on the relative amount of material in the adsorbate layer (coverage) and the distance between atoms in the top layer of the substrate and in the adsorbate layer as a function of electrode potential can be derived from SDD measurements. 

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