Study of size anisotropy

Louer and Langford [LAN 86, LAN 93, LAN 96] in particular studied this situation. These authors showed that it is possible, through a careful study of how the peak widths behave with respect to the Miller indices, to accurately determine the average shape of nanociystals. This method can be illustrated by a study we 

4 This list is not comprehensive and other type of defeets ean lead to an anisotropic widening of the diffraction peaks. 

Regardless of why the integral breadth of the peaks is estimated, the peak fitting has to be done carefully in order to obtain truly significant widths, particularly when it comes to the peak tails. Generally speaking, miciostmctural studies require veiy 

Measurements of integral breadths by whole pattern fitting 

Since the early 1980s, a new way of quantifying structural defects has appeared. It consists of applying the developments implemented in stmctural analysis to the increase in peak width [KEl 83, LUT 90, THO 87b, LEB 92, LEB 99], This method, which relies on Rietveld s stmctural analysis method, consists of a whole pattern fitting of the diffraction pattern. 

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