Specific Heat and Breaking Limit

According to Egerton et al. [26], the temperature rise of a TEM specimen in micrometer size caused by electron beam radiation in the TEM is less than 2 K. The heat energy released from bond stretching may contribute to the acmal temperature of the specimen, but it is expected to be insignificant for the small samples and is common to all measurements. 

Likewise, the 16-19 % elongation limits of Ir-MC and Pt-MC measured using an STM at 4.2 K are also within the framework. The divergent values of the breaking limits measured at the ambient temperature are dominated by the extensibility factor that increases exponentially with temperature and reaches infinity at Tm,i- The thermal and mechanical fluctuations in the measurement become significant. 

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