Special Techniques and Variations

Since the consumers of the TEM technique come from a wide variety of backgrounds, interesting variations of sample preparation are introduced all the time. Some examples of unusual approaches are as follows [8]  

In summary, sample preparation is an essential part of microscopy and there are many techniques (and variations) that can be used. The approaches very commonly used to prepare specimens for analysis are as follows The sample needs to be cut to size using one of the slicing methods outlined. The cut sample is either set in a mold or mounted externally on a polishing mount. This step is followed by a series of coarser to finer grinding on SiC grit 

Ion-beam thinning Universally applicable good for two-phase materials and chemically resistant materials large thin areas reproducible Slow, ion-beam damage and structural alterations often possible 

Chemical thinning Quick Not easy to control chemical recipes for new materials often not available 

Electropolishing Quick and controllable Applicable to electrical conductors only 

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