SIMS by fingerprinting

Another application, using FARMS, in which the association of Pt and Sn on y-alumina with a high surface area as measured by BET, was studied by monitoring PtSn and PtSnO secondary cluster ions, has been de.scribed in Ref. 47. The interpretation, supported by dedicated TPR studies, was that Sn. Pt and O are nearest neighbors at the surface of the catalyst, which is a prerequisite 

The usefulness of SSIMS in the field of catalysis-related surface science is already well known. SSIMS studies of CO adsorption on single-crystal surfaces of Cu, Ru. Ni, Pd and Pt have been summarized briefly [45). The ob.ser-vation that different CO adsorption structures (linearly bonded, bridged, triple bridged and mixed states) can be distinguished by the characteristic MeiCO+ (-V = 1, 2, 3) secondary cluster-ion yield fractions in the SSIMS spectra, i.e.. by fingerprinting, confirms that these rather delicate structures can be identified by the method. 

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