Scherrer-Williamson-Hall methodology

In Equation 4.1, the factor fiF(0) is included, which is the peak profile function, that describes particle size broadening and other sources of peak broadening. The XRD method can be used as well for the measurement of the crystallite size of powders by applying the Scherrer-Williamson-Hall methodology [4,35], In this methodology, the FWHM of a diffraction peak, p, is affected by two types of defects, that is, the dislocations, which are related to the stress of the sample, and the grain size. It is possible to write [35]... 

The crystallite size of the BaCe0 95Yb0 05O3 5 perovskite powder was calculated following the method previously explained, that is, the Scherrer-Williamson-Hall methodology [4,35,36], The calculated radius of the perovskite crystallite, considered as spherical particles, was a = = 71 + I nm. 

---