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Scanning probe microscopy variant

This section describes a variant of SPM where condncing probes are used to measure the current-voltage (J-V) relationship and resistance (conductance) of conducting materials. Conducting probe AFM (CP-AFM) is also called conducting AFM, current-sensing AFM [11,126], or scanning resistance microscopy [127,128]. [Pg.319]

See other pages where Scanning probe microscopy variant is mentioned: [Pg.228]    [Pg.216]    [Pg.124]    [Pg.141]    [Pg.1]    [Pg.378]    [Pg.139]    [Pg.252]    [Pg.1836]    [Pg.268]    [Pg.211]    [Pg.310]    [Pg.26]    [Pg.16]    [Pg.197]    [Pg.77]    [Pg.79]    [Pg.119]    [Pg.254]    [Pg.197]    [Pg.6278]    [Pg.298]    [Pg.81]    [Pg.312]    [Pg.6277]    [Pg.379]    [Pg.247]    [Pg.1262]    [Pg.483]    [Pg.146]    [Pg.135]    [Pg.273]    [Pg.357]    [Pg.135]    [Pg.293]   
See also in sourсe #XX -- [ Pg.319 ]



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Scanning probe microscopy

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