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Roughening exponent

The exponents ft and a are the growth and scaling exponents respectively. In both the EW and LG models, the surface width saturates, and the roughening is stable. [Pg.170]

Using atomic force microscopy (AFM), the kinetic surface roughening in electrochemical dissolution of nickel films at a low constant current density was studied in order to reveal the scaling laws [33]. The surface measurements of AFM exhibited the oscillatory variation of the interface width with time, which made it impossible to determine the growth exponent p. The oscillatory behavior of surface... [Pg.502]


See other pages where Roughening exponent is mentioned: [Pg.273]    [Pg.275]    [Pg.273]    [Pg.275]    [Pg.170]    [Pg.150]    [Pg.503]    [Pg.381]    [Pg.137]    [Pg.503]    [Pg.1117]    [Pg.166]    [Pg.498]    [Pg.3982]    [Pg.412]    [Pg.415]    [Pg.291]   
See also in sourсe #XX -- [ Pg.91 , Pg.92 , Pg.93 , Pg.94 , Pg.121 ]




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