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Room temperature growth mode

We studied room temperature film growth modes and electric properties of Yb/Si(lll) system by AES, EELS and in situ 6-probe Hall measurements. Surface morphology of the films was characterized by atomic force microscopy (AFM). [Pg.206]

See other pages where Room temperature growth mode is mentioned: [Pg.86]    [Pg.36]    [Pg.133]    [Pg.442]    [Pg.513]    [Pg.24]    [Pg.93]    [Pg.113]    [Pg.220]    [Pg.221]    [Pg.222]    [Pg.14]    [Pg.86]    [Pg.175]    [Pg.180]    [Pg.350]    [Pg.642]    [Pg.27]    [Pg.259]    [Pg.681]    [Pg.18]    [Pg.75]    [Pg.173]    [Pg.55]    [Pg.56]    [Pg.429]    [Pg.427]    [Pg.456]    [Pg.221]    [Pg.511]    [Pg.76]    [Pg.536]    [Pg.650]    [Pg.228]    [Pg.323]    [Pg.331]    [Pg.148]    [Pg.52]    [Pg.146]    [Pg.778]   
See also in sourсe #XX -- [ Pg.55 ]



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