Required Corrections of the Scattering Intensity

Special care has to be taken concerning data pre-evaluation if the scattering of highly oriented nanostmctures are investigated in symmetrical reflection or at grazing incidence. Absorption correction is delicate (cf. Sect. 7.6.3). Even a refraction correction (Sect. 7.6.5) may be necessary.  

Ruland and Smarsly [9,84,240] can analyze their recorded data in the classical Born approximation, but have to correct for the special geometry of the grazing incidence experiment. They propose not to carry out the necessary corrections in a 

Here w is a weighting factor. Asr (s) is the absorption factor (in this case for symmetrical absorption), (s) and fyi consider the non-ideal character of the two-phase topology (cf. p. 124, Fig. 8.10) by consideration of a smooth phase transition zone and density fluctuations inside the phases. 

The analytical structural model for the topology of the nanostructure is defined in Isr (s). For many imaginable topologies such models can be derived by application of scattering theory. Several publications consider layer topologies [9,84,231] and structural entities built from cylindrical particles [240,241]. In the following sections let us demonstrate the principle procedure by means of a typical study [84]. 

Let us consider a nanostructured thin film built from lamellar particles [84]. If the principal axis of layer stacks is oriented normal to the film surface, the scattered intensity measured in symmetrical-reflection geometry (SRSAXS) is 

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